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RoboClock™ and RoboClock II™ Test Mode | サイプレス セミコンダクタ

RoboClock™ and RoboClock II™ Test Mode

最終更新日: 
2020年5月28日
バージョン: 
*B
This document discusses the test mode capabilities of the RoboClock™ and RoboClock II™ family. It begins with an introduction to these devices and then discusses how to use the test mode features. The RoboClock II test mode disables the PLL, which allows you to debug your system design. Using the test mode function can improve your design and give you additional stability.

This document discusses the test mode capabilities of the RoboClock™ and RoboClock II™ family. It begins with an introduction to these devices and then discusses how to use the test mode features. The RoboClock II test mode disables the PLL, which allows you to debug your system design. Using the test mode function can improve your design and give you additional stability.