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AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates | サイプレス セミコンダクタ

AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates

最終更新日: 
2020年5月28日
バージョン: 
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This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life¿ MoBL®SRAM, and Nonvolatile SRAM (nvSRAM).

This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life™ MoBL® SRAM, and Nonvolatile SRAM (nvSRAM) but does not contain soft error rate (SER) data for any of the SRAMs. Individual datasheets for Synchronous SRAMs list the derived accelerated neutron failure rates.

翻訳版のドキュメントは参照用です。設計開発に携わっている場合には、英語版のドキュメントを参照されることをお勧めします。